Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)

Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Topography of Thin Layer Material Surface with Atomic Force Microscope Method (AFM)
Rp 2.500.000

SERVICE DESCRIPTION | ----

  • KST Serpong (Bacharuddin Jusuf Habibie)
  • Service Unit: Per Sample
  • Service Duration: 14 Working Days
  • Service Quota Per Day: 1
  • Service Capacity: 1 Per Sample